TEM Sample Preparation

Sample preparation is a necessary prerequisite for transmission electron microscopy (TEM). The advent of focused ion beam (FIB) workstations for the preparation of electron transparent lamellae has revolutionized TEM specimen preparation. An advanced analytical tool combined with a high-precision nanomanipulation system gives you the benefit of sample preparation techniques that are faster, more accurate, more reproducible and more reliable.

The media below shows examples of how fast and easy it is to perform in-situ lift-out using our various unique approaches and products.