CryoLO - CryoTEM sample preparation
About
Performing in situ cryo TEM sample liftouts of site specific TEM slices prepared in cryo FIBs is in increasing demand. Thus Kleindiek Nanotechnik offers cryo solutions for addressing TEM sample preparation under cryogenic conditions. This entails insulating the tool tip from the micromanipulator itself and thermally connecting the tool to the cryoFIB's anti-contamination shield. In this manner a liftout needle can be cooled to cryogenic temperature and used to perform sample liftout.
Relying on our experience in manufacturing microgrippers for standard TEM sample preparation, we've designed a cryo-compatible version of the microgrippers that can be cooled to LN2 temperatures. This allows transferring lamella easily and without the use of water vapour or other gases.
Specifications (click to expand)
MM3A-EM micromanipulator
Length: 62.1 mm
Width: 20.4 mm
Height: 25.4 mm
Resolution A: 7 nrad (0.5 nm)
Resolution B: 7 nrad (0.2 nm)
Resolution C: < 0.05 nmLowest pressure: 10⁻⁷ mbar
Material: Stainless steel, aluminium
A = left / right B = up / down C = in / out
cryo-MGS microgripper
Total length: 28 mm
Tip length: 5 mm
Height: 5 mm
Gripping area: (5 to 10 µm)²
Resolution: 20 nm
Gripping force: 5 µN to 5000 µN (variable)
Maximum span range: 20 to 40 µm
Temperature range: 77 K to 353 K
Lowest pressure: 10⁻⁷ mbar
Included Accessories
iLO control software
Mounting kit
All technical specifications are approximate. Due to continuous development, we reserve the right to change specifications without notice.
Advantages (click to expand)
Unique solution for cryo TEM sample preparation
Simple, gentle grip for retrieving samples
No need for water vapour injection
Interfacing solutions for most microscopes and cryo systems
Fast setup and removal
Clear and simple
Result-oriented operation and increased throughput
Intuitive control software
User-friendly and easy to learn
Compact, stand-alone electronics with PC interface
Robust and stable
Compact construction delivers higher resonance frequencies
Excellent stability
Low drift (1 nm/min)
Reliable operation (one year endurance test)
Virtually insusceptible to vibrations
Fast and precise
No backlash or reversal play
Sub-nanometer resolution (0.25 nm)
No "blind axis" like with cartesian systems
Integrated coarse and fine displacement in one drive
