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About
About
The SFLT10 substage is fitted with next generation piezo technology. Its primary use is in SEM/FIB, coupled with the Prober Shuttle, where it provides smooth and precise two- or three-dimensional movement of the sample. It's extremely low profile makes it ideal for other uses in tight spots.
Specifications (click to expand)
Specifications (click to expand)
Overview
Overview
Length: 33 mm
Width: 33 mm
Height: 3.5 mm
Travel: XY = 10 mm
Speed: up to 1 mm/s
Resolution: < 0.02 nm
Temperature range: 273 K to 353 K
Lowest pressure: 10⁻⁷ mbar
Substage mounting: 4 x 2 mm holes
Material: Stainless steel
All technical specifications are approximate. Due to continuous development, we reserve the right to change specifications without notice.
Advantages (click to expand)
Advantages (click to expand)
Compact and flexible
Compact and flexible
Small and practical
Plug-and-play system with modular components
Interfacing solutions for most microscopes
Fast setup and removal
Clear and simple
Clear and simple
Result-oriented operation and increased throughput
Intuitive control interfaces and software
User-friendly and easy to learn
Compact, stand-alone electronics with PC interface
Pioneering cabling technology
Robust and stable
Robust and stable
Compact construction delivers higher resonance frequencies
Excellent stability
Low drift (1 nm/min)
Reliable operation (one year endurance test)
Virtually insusceptible to vibrations
Fast pre-positioning by hand
Fast and precise
Fast and precise
No backlash or reversal play
Sub-nanometer resolution (0.02 nm)
Integrated coarse and fine displacement in one drive
High operating velocity (up to 1 mm/sec)
Smooth motion
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