Recent Highlights

Nanoprobing on 3 nm technology transistors

Nanoprobing: 3 nm technology EBIC

Nanoprobing: 3 nm technology EBAC

Nanoprobing: 5 nm, multiple EBAC traces

Weld-free mounting of lamellae for electrical biasing operando TEM

Operando two-terminal devices inside a transmission electron microscope

Stacking 2D Materials

ACS Nano 2022, 16, 1836−1846

https://doi.org/10.1021/acsnano.1c09122